Tolerance Analysis of Electronic Circuits Using MATHCAD
Robert Boyd, University of California, Irvine, California, USA
Robert Boyd, University of California, Irvine, California, USA
CRC Press
Features
- Offers step-by-step procedures for performing the analyses essential to the circuit design process
- Provides methods and techniques that have immediate practical application in the workplace
- Shows that Spice-derived CAD programs yield incorrect results in ac worst-case analyses
- Includes 31 MATHCAD m-files
- Serves everyone involved in the design and manufacturing processes, from specification writers to quality assurance, system, test, reliability, and design engineers
- SummaryWritten for the practicing electronics professional, Tolerance Analysis of Electronic Circuits Using MATHCAD offers a comprehensive, step-by-step treatment of methods used to perform analyses essential to the design process of circuit cards and systems of cards, including:
- worst-case analysis,
- limits for production testing,
- component stress analysis,
- determining if a design meets specification limits, and
- manufacturing yield analysis
Using a practical approach that allows engineers and technicians to put the techniques directly into practice, the author presents the mathematical procedures used to determine performance limits. The topics and techniques discussed include extreme value and root-sum-square analysis using symmetric and asymmetric tolerance, Monte Carlo analysis using normal and uniform distributions, sensitivity formulas, tolerance analyses of opamp offsets, and anomalies of high-Q ac circuits.
ISBN: 9780849323393
ISBN 10: 0849323398
Publication Date: September 24, 1999
Number of Pages: 216
